A research team from Queen Mary University of London has discovered a new way to engineer thin films that can "tune" ...

Researchers from Tokyo Metropolitan University have developed a new atomically layered material which experiences a five order of magnitude resistivity reduction when oxidized, more than a hundred ...

A four-year analysis conducted at a testing field in eastern Poland has shown that crystalline solar panels offer a stronger performance than thin-film panels at high latitudes. The tests revealed ...

Abstract: Measurements of the surface impedance of conducting, semiconducting, and superconducting materials are commonly used in research, metrology, and industry to extract and study the resistivity ...

Abstract: This letter presents a compact method for the precise permittivity extraction of thin films, offering both high sensitivity and a fixed measurement frequency. The proposed system integrates ...

Institute of Railway and Urban Rail Transit, Tongji University, Shanghai, China This study describes a method for preparing thermocouple sensor based on NiCr/NiSi thin films. Using magnetron ...

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

Ellipsometry and reflectometry are optical measurement techniques used for surface analysis and thin-film characterization. 1 Both methods rely on light reflection but differ in their approach.

To meet exacting specs for ultra-thin GRIN lenses, Peak Nano turned to ABTech for a groundbreaking system that delivered precision measurement, rapid sorting, and unmatched performance. This case ...