Environmental Scanning Electron Microscopy (ESEM) represents a significant evolution of conventional scanning electron microscopy. By utilising variable pressure conditions rather than the high vacuum ...
The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips ...
Erica Fleishman does not work for, consult, own shares in or receive funding from any company or organization that would benefit from this article, and has disclosed no relevant affiliations beyond ...
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